This seminar will provide an introduction to the basic principles and key techniques involved in the characterization of materials, which is crucial for understanding the relationship between a material’s processing, structure, properties, and performance.

A range of characterization methods will be introduced, including spectroscopic techniques such as FTIR, UV-Vis, PL, Raman, XPS, and EDS, which are essential for analyzing composition, electronic structure, molecular interactions, and bonding. Additionally, diffraction techniques like XRD and electron diffraction will be discussed for their role in determining crystal structure, phase composition, and nanoscale crystallinity.

Microscopy techniques, specifically SEM and (S)TEM, will be presented for examining surface morphology, particle size, interfaces, defects, and other nano- and atomic-scale structures.

The seminar will also cover other characterization methods, such as thermal analysis techniques (TGA/DSC) for studying material stability and phase transitions, as well as particle size and zeta potential analysis for characterizing dispersions, colloidal stability, and nanomaterials. Special attention will be given to the limitations of different characterization techniques. Example studies related to energy and nanoscale materials will be discussed to illustrate these techniques.

The seminar will emphasize the critical relationship between structure and properties, demonstrating how details at the atomic, nanoscale, and microstructural levels influence material behavior.